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1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 202 203 204 205 206 207 208 209 210 211 212 213 214 215 216 217 218 219 220 221 222 223 224 225 226 227 228 229 230 231 232 233 234 235 236 237 238 239 240 241 242 243 244 245 246 247 248 249 250 251 252 253 254 255 256 257 258 259 260 261 262 263 264 265 266 267 268 269 270 271 272 273 274 275 276 277 278 279 280 281 282 283 284 285 286 287 288 289 290 291 292 293 294 295 296 297 298 299 300 301 302 303 304 305 306 307 308 309 310 311 312 313 314 315 316 317 318 319 320 321 322 323 324 325 326 327 328 329 330 331 332 333 334 335 336 337 338 339 340 341 342 343 344 345 346 347 348 349 350 351 352 353 354 355 356 357 358 359 360 361 362 363 364 365 366 367 368 369 370 371 372 373 374 375 376 377 378 379 380 381 382 383 384 385 386 387 388 389 390 391 392 393 394 395 396 397 398 399 400 401 402 403 404 405 406 407 408 409 410 411 412 413 414 415 416 417 418 419 420 421 422 423 424 425 426 427 428 429 430 431 432 433 434 435 436 437 438 439 440 | /* SPDX-License-Identifier: GPL-2.0+ */ /* * Copyright (c) 2013 Google, Inc. */ #ifndef __TEST_TEST_H #define __TEST_TEST_H #include <abuf.h> #include <malloc.h> #include <linux/bitops.h> #define UT_MAX_ARGS 8 #define UT_PRIV_SIZE 256 /** * struct ut_stats - Statistics about tests run * * @fail_count: Number of tests that failed * @skip_count: Number of tests that were skipped * @test_count: Number of tests run. If a test is run muiltiple times, only one * is counted * @start: Timer value when test started * @duration_ms: Suite duration in milliseconds */ struct ut_stats { int fail_count; int skip_count; int test_count; ulong start; ulong duration_ms; }; /** * enum ut_arg_type - Type of a unit test argument * * @UT_ARG_INT: Integer argument (hex with 0x prefix, or decimal) -> vint * @UT_ARG_BOOL: Boolean argument (0 or 1) -> vbool * @UT_ARG_STR: String argument -> vstr */ enum ut_arg_type { UT_ARG_INT, UT_ARG_BOOL, UT_ARG_STR, }; /** * struct ut_arg - Parsed unit test argument value * * Holds the parsed value of an argument after command-line processing. * * @name: Name of the argument (points to ut_arg_def.name) * @type: Type of the argument * @provided: true if value was provided on command line * @vint: Integer value (when type is UT_ARG_INT) * @vbool: Boolean value (when type is UT_ARG_BOOL) * @vstr: String value (when type is UT_ARG_STR, points into argv) */ struct ut_arg { const char *name; enum ut_arg_type type; bool provided; union { long vint; bool vbool; const char *vstr; }; }; /* * struct unit_test_state - Entire state of test system * * @cur: Statistics for the current run * @total: Statistics for all test runs * @run_count: Number of times ut_run_list() has been called * @worst: Sute which had the first per-text run time * @worst_ms: Time taken by that test * @start: Store the starting mallinfo when doing leak test * @of_live: true to use livetree if available, false to use flattree * @of_root: Record of the livetree root node (used for setting up tests) * @root: Root device * @testdev: Test device * @force_fail_alloc: Force all memory allocs to fail * @skip_post_probe: Skip uclass post-probe processing * @fdt_chksum: crc8 of the device tree contents * @fdt_copy: Copy of the device tree * @fdt_size: Size of the device-tree copy * @other_fdt: Buffer for the other FDT (UTF_OTHER_FDT) * @other_fdt_size: Size of the other FDT (UTF_OTHER_FDT) * @of_other: Live tree for the other FDT * @runs_per_test: Number of times to run each test (typically 1) * @force_run: true to run tests marked with the UTF_MANUAL flag * @workers: Number of parallel workers, 0 if not sharding tests * @worker_id: ID of this worker (0 to workers-1) * @old_bootstage_count: bootstage record count saved before each test * @old_bloblist: stores the old gd->bloblist pointer * @soft_fail: continue execution of the test even after it fails * @expect_str: Temporary string used to hold expected string value * @actual_str: Temporary string used to hold actual string value * @args: Parsed argument values for current test * @arg_count: Number of parsed arguments * @arg_error: Set if ut_str/int/bool() detects a type mismatch * @keep_record: Preserve console recording when ut_fail() is called * @emit_result: Emit result line after each test completes * @leak_check: Check for memory leaks around each test * @video_ctx: Vidconsole context for test message display (allocated on use) * @video_save: Saved framebuffer region for video tests * @priv: Private data for tests to use as needed */ struct unit_test_state { struct ut_stats cur; struct ut_stats total; int run_count; const struct suite *worst; int worst_ms; struct mallinfo start; struct device_node *of_root; bool of_live; struct udevice *root; struct udevice *testdev; int force_fail_alloc; int skip_post_probe; uint fdt_chksum; void *fdt_copy; uint fdt_size; void *other_fdt; int other_fdt_size; struct device_node *of_other; int runs_per_test; bool force_run; int workers; int worker_id; uint old_bootstage_count; void *old_bloblist; bool soft_fail; char expect_str[1024]; char actual_str[1024]; struct ut_arg args[UT_MAX_ARGS]; int arg_count; bool arg_error; bool keep_record; bool emit_result; bool leak_check; void *video_ctx; struct abuf video_save; char priv[UT_PRIV_SIZE]; }; /* Test flags for each test */ enum ut_flags { UTF_SCAN_PDATA = BIT(0), /* test needs platform data */ UTF_PROBE_TEST = BIT(1), /* probe test uclass */ UTF_SCAN_FDT = BIT(2), /* scan device tree */ UTF_FLAT_TREE = BIT(3), /* test needs flat DT */ UTF_LIVE_TREE = BIT(4), /* needs live device tree */ UTF_CONSOLE = BIT(5), /* needs console recording */ UTF_NO_SILENT = BIT(6), /* console cannot be silent */ /* do extra driver model init and uninit */ UTF_DM = BIT(7), UTF_OTHER_FDT = BIT(8), /* read in other device tree */ /* * Only run if explicitly requested with 'ut -f <suite> <test>'. The * test name must end in "_norun" so that pytest detects this also, * since it cannot access the flags. */ UTF_MANUAL = BIT(9), UTF_ETH_BOOTDEV = BIT(10), /* enable Ethernet bootdevs */ UTF_SF_BOOTDEV = BIT(11), /* enable SPI flash bootdevs */ UFT_BLOBLIST = BIT(12), /* test changes gd->bloblist */ UTF_INIT = BIT(13), /* test inits a suite */ UTF_UNINIT = BIT(14), /* test uninits a suite */ }; /** * enum ut_arg_flags - Flags for unit test arguments * * @UT_ARGF_OPTIONAL: Argument is optional; use default value if not provided */ enum ut_arg_flags { UT_ARGF_OPTIONAL = BIT(0), }; /** * struct ut_arg_def - Definition of a unit test argument * * Declares an expected argument for a test, including its name, type, * whether it is optional, and its default value. * * @name: Name of the argument (used in key=value matching) * @type: Type of the argument (int, bool, or string) * @flags: Argument flags (e.g., UT_ARGF_OPTIONAL) * @def: Default value (used when argument is optional and not provided) */ struct ut_arg_def { const char *name; enum ut_arg_type type; int flags; union { long vint; bool vbool; const char *vstr; } def; }; /** * struct unit_test - Information about a unit test * * @name: Name of test * @func: Function to call to perform test * @flags: Flags indicated pre-conditions for test * @arg_defs: Argument definitions (NULL-terminated array), or NULL */ struct unit_test { const char *file; const char *name; int (*func)(struct unit_test_state *state); int flags; const struct ut_arg_def *arg_defs; }; /** * UNIT_TEST() - create linker generated list entry for unit a unit test * * The macro UNIT_TEST() is used to create a linker generated list entry. These * list entries are enumerate tests that can be execute using the ut command. * The list entries are used both by the implementation of the ut command as * well as in a related Python test. * * For Python testing the subtests are collected in Python function * generate_ut_subtest() by applying a regular expression to the lines of file * u-boot.sym. The list entries have to follow strict naming conventions to be * matched by the expression. * * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite * foo that can be executed via command 'ut foo bar' and is implemented in * function foo_test_bar(). * * @_name: concatenation of name of the test suite, "_test_", and the name * of the test * @_flags: an integer field that can be evaluated by the test suite * implementation (see enum ut_flags) * @_suite: name of the test suite concatenated with "_test" */ #define UNIT_TEST(_name, _flags, _suite) \ ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \ .file = __FILE__, \ .name = #_name, \ .flags = _flags, \ .func = _name, \ } /* init function for unit-test suite (the 'A' makes it first) */ #define UNIT_TEST_INIT(_name, _flags, _suite) \ ll_entry_declare(struct unit_test, A ## _name, ut_ ## _suite) = { \ .file = __FILE__, \ .name = #_name, \ .flags = (_flags) | UTF_INIT, \ .func = _name, \ } /* uninit function for unit-test suite (the 'aaa' makes it last) */ #define UNIT_TEST_UNINIT(_name, _flags, _suite) \ ll_entry_declare(struct unit_test, zzz ## _name, ut_ ## _suite) = { \ .file = __FILE__, \ .name = #_name, \ .flags = (_flags) | UTF_UNINIT, \ .func = _name, \ } /** * UNIT_TEST_ARGS() - create unit test entry with inline argument definitions * * Like UNIT_TEST() but allows specifying argument definitions inline. * The variadic arguments are struct ut_arg_def initializers. The NULL * terminator is added automatically by the macro. * * Example: * UNIT_TEST_ARGS(my_test, UTF_CONSOLE, my_suite, * { "path", UT_ARG_STR }, * { "count", UT_ARG_INT, UT_ARGF_OPTIONAL, { .vint = 10 } }); * * @_name: Test function name * @_flags: Test flags (see enum ut_flags) * @_suite: Test suite name * @...: Argument definitions (struct ut_arg_def initializers) */ #define UNIT_TEST_ARGS(_name, _flags, _suite, ...) \ static const struct ut_arg_def _name##_args[] = { __VA_ARGS__, { NULL } }; \ ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \ .file = __FILE__, \ .name = #_name, \ .flags = _flags, \ .func = _name, \ .arg_defs = _name##_args, \ } /* Get the start of a list of unit tests for a particular suite */ #define UNIT_TEST_SUITE_START(_suite) \ ll_entry_start(struct unit_test, ut_ ## _suite) #define UNIT_TEST_SUITE_COUNT(_suite) \ ll_entry_count(struct unit_test, ut_ ## _suite) /* Use ! and ~ so that all tests will be sorted between these two values */ #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!) #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~) #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START()) /* Sizes for devres tests */ enum { TEST_DEVRES_SIZE = 100, TEST_DEVRES_COUNT = 10, TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT, /* A few different sizes */ TEST_DEVRES_SIZE2 = 15, TEST_DEVRES_SIZE3 = 37, }; /** * testbus_get_clear_removed() - Test function to obtain removed device * * This is used in testbus to find out which device was removed. Calling this * function returns a pointer to the device and then clears it back to NULL, so * that a future test can check it. */ struct udevice *testbus_get_clear_removed(void); #ifdef CONFIG_SANDBOX #include <asm/state.h> #include <asm/test.h> #endif static inline void arch_reset_for_test(void) { #ifdef CONFIG_SANDBOX state_reset_for_test(state_get_current()); #endif } static inline int test_load_other_fdt(struct unit_test_state *uts) { int ret = 0; #ifdef CONFIG_SANDBOX ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size); #endif return ret; } /** * Control skipping of time delays * * Some tests have unnecessay time delays (e.g. USB). Allow these to be * skipped to speed up testing * * @param skip_delays true to skip delays from now on, false to honour delay * requests */ static inline void test_set_skip_delays(bool skip_delays) { #ifdef CONFIG_SANDBOX state_set_skip_delays(skip_delays); #endif } /** * test_set_eth_enable() - Enable / disable Ethernet * * Allows control of whether Ethernet packets are actually send/received * * @enable: true to enable Ethernet, false to disable */ static inline void test_set_eth_enable(bool enable) { #ifdef CONFIG_SANDBOX sandbox_set_eth_enable(enable); #endif } /* Allow ethernet to be disabled for testing purposes */ static inline bool test_eth_enabled(void) { bool enabled = true; #ifdef CONFIG_SANDBOX enabled = sandbox_eth_enabled(); #endif return enabled; } /* Allow ethernet bootdev to be ignored for testing purposes */ static inline bool test_eth_bootdev_enabled(void) { bool enabled = true; #ifdef CONFIG_SANDBOX enabled = sandbox_eth_enabled(); #endif return enabled; } /* Allow SPI flash bootdev to be ignored for testing purposes */ static inline bool test_sf_bootdev_enabled(void) { bool enabled = true; #ifdef CONFIG_SANDBOX enabled = sandbox_sf_bootdev_enabled(); #endif return enabled; } static inline void test_sf_set_enable_bootdevs(bool enable) { #ifdef CONFIG_SANDBOX sandbox_sf_set_enable_bootdevs(enable); #endif } static inline bool test_flattree_test_enabled(void) { #ifdef CONFIG_SANDBOX struct sandbox_state *state = state_get_current(); return !state->no_flattree_tests; #else return true; #endif } static inline bool test_soft_fail(void) { #ifdef CONFIG_SANDBOX struct sandbox_state *state = state_get_current(); return state->soft_fail; #else return false; #endif } #endif /* __TEST_TEST_H */ |